CCMX - ScopeM Advanced Course - Advanced Characterization of Materials at the Micro, Nano and Atomic Scales
MSE-655
This file is part of the content downloaded from CCMX - ScopeM Advanced Course - Advanced Characterization of Materials at the Micro, Nano and Atomic Scales.
- Shuttle to and from central Zürich (URL)
- Directions to ScopeM (File)
- Campus map (File)
- Course schedule (File)
- Announcements (Forum)
- Instrument Visits Groups (File)
4 November
- Gramm - Electron Diffraction (Folder)
- Sologubenko_(S)TEM for Complex Material Characterization (File)
- Alexander - Analytical electron microscopy (EELS and EFTEM) (Folder)
- Alan Maigne_Advanced Electron Microscopy (File)
- Boureau - DPC and 4D-STEM: concepts and application (Folder)
5 November
- Erni - Aberration corrected TEM (Folder)
- Schäublin - TEM Image Simulations (Folder)
- Bilal Qureshi (File)
- Lucas - Correlative Microscopy (Folder)
- Kunze - Analytical SEM (EDX and EBSD) (Folder)
6 November
- Reuteler - Focused Ion Beam (FIB) Fundamentals and Applications (Folder)
- Gerstl - Atom Probe Tomography (Folder)
- Seitz - Light Microscope, Fundamentals and Applications (Folder)
- Lee - Raman Instrument and applications (Folder)