Metrology practicals
MICRO-429
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- Announcements (Forum)
- Course Introduction 2025 (File)
- MICRO-429 Planning Example (File)
- MICRO-429 Planning - v2 01/04/2025 (File)
Week 1 - Introduction (February 18)
Week 2 - Preliminary Handouts (2024 Edition) (February 25)
- T1-SEM: Scanning electron microscopy [2025] (File)
- T2.1 & T2.2 "Atomic Force Microscopy" Documentation [2024] (File)
- T3 v3 "Dark Count Rate & Afterpulsing statistics in photon-counting devices" Manuals & Documentation [2024] (File)
- T4 v3 "Sensitivity in photon-counting devices" Manuals & Documentation [2024] (File)
- T5 v3 "Timing jitter measurements in single-photon detectors" Manuals & Documentation [2024] (File)
Week 3
Week 4
Week 5
Week 6 - Final Handouts (2025 Edition) (March 25)
- T1-SEM: Scanning electron microscopy [2025] (File)
- T2.1 & T2.2 "Atomic Force Microscopy" Documentation [2025] (File)
- T3 v3 "Dark Count Rate & Afterpulsing statistics in photon-counting devices" Manuals & Documentation [2025] (File)
- T4 v3 "Sensitivity in photon-counting devices" Manuals & Documentation [2025] (File)
- T5 v3 "Timing jitter measurements in single-photon detectors" Manuals & Documentation [2025] (File)
Week 7 - Preparation Class (13:15-15:00 BC 02) (April 1)
- Metrology Practicals - Summary T3-T5 (File)
- Metrology Practicals - Introduction T3-T5 (File)
- Metrology Practicals - Introduction - T1 - SEM (File)
- Metrology Practicals - Supplementary T1- To Print (File)
- AFM practical introduction (File)