Metrology

MICRO-428

This file is part of the content downloaded from Metrology.
Course summary


Week1 - February 17: Introduction class, Système International (SI)


Week2 - February 24: Optical Metrology/1 (Optical Image Sensors)


Week3 - March 3: Optical Metrology/2 (SPADs)


Week4 - March 10: Optical Metrology/3 (Optical Microscopy)


Week5 - March 17: Nanoscale Metrology/1 (SEM)


Week6 - March 24: Nanoscale Metrology/2 (AFM)


Week7 - March 31: Nanoscale Metrology/3 (Nanomagnetism)


Week8 - April 7: Basic Statistics/1


Week9 - April 14: Basic Statistics/2


Week10 - April 28: Electrical Metrology/1


Week11 - May 5: Electrical Metrology/2


Week12 - May 12: Electrical Metrology/3


Week13 - May 19: Quantum Metrology/1

https://epfl.zoom.us/j/67390483116


Week14 - May 26: Quantum Metrology/2

https://epfl.zoom.us/j/67846020355?pwd=oHuyaaBGYZbFAOYVGnnmuKL8ulyHKu.1


Q&A Session - June 13 @13:30 in ELG 116