Advanced Solid State and Surface Characterization
CH-633
General Information
The lectures are held every Wednesday (except for March 18th, which is a Tuesday), starting on February 12th, from 10:00 AM to 12:00 PM on Zoom.
Session 1 | 12 February 2025
Introduction and Surface Diffraction | Pascal Schouwink
Session 2 | 19 February 2025
HRXRD, Texture and XRR | Pascal Schouwink
Session 3 | 26 February 2025
Small Angle X-ray Scattering | Pascal Schouwink
Session 4 | 5 March 2025
Total scattering and PDF | Pascal Schouwink
Session 5 | 12 March 2025
X-ray Photoelectron Spectroscopy - Part 1 | Mounir Mensi
Session 6 | 18 March 2025
X-ray Photoelectron Spectroscopy - Part 2 | Mounir Mensi
Session 7 | 26 March 2025
X-ray Photoelectron Spectroscopy - Part 3 | Mounir Mensi
Session 8 | 02 April 2025
X-ray Photoelectron Spectroscopy - Part 4 | Mounir Mensi
Session 9 | 09 April 2025
Scanning probe microscopy & Raman / IR | Mounir Mensi
Session 10 | 16 April 2025
Raman/IR and combined techniques - Part 6 | Mounir Mensi
Session 11 | 23 April 2025
Scanning Electron Microscopy Techniques | Emad Oveisi
Session 12 | 30 April 2025
Transmission Electron Microscopy Techniques | Emad Oveisi
Exam
Date: May 28th from 09:00 to 11:00.
The exam will take place on-site at:
EPFL VS: Emosson
EPFL Lausanne: CH H1 625
The exam format will comprise multiple-choice questions (MCQ) and exercises, with a focus on concepts rather than complex calculations. Feel free to refer to your lecture notes during the exam. Additionally, please ensure you have a calculator capable of performing basic trigonometric functions for simple calculations.