Scanning and Analytical Transmission Electron Microscopy

Exam date: TBA, MXC-116 (CIME library)

Exam: you select a paper that shows the use of one or several advanced EM techniques and present a 10min. summary to the experts. Then we ask you questions related to this and other techniques that have been presented in the course for another 10 min.

Total time 20min. (10&10). Individual presentations, order will be determined later.

Please send us a copy of the paper beforehand for approval (1 week before exam).

Room MED01618

10:00-10:15 Welcome

10:15-12:00 Introduction to STEM, Dr Emad Oveisi

lunch

13:15-14:15 EELS Basics, Dr David Reyes

14:30-16:30 STEM beyond conventional imaging with pixelated detectors, Dr Victor Boureau

ROOM MED01618

laptop (PC or Mac) required

08:30-09:30 Aberration-corrected TEM vs STEM, Dr Victor Boureau

09:45-10:30 Phase Contrast Imaging in TEM, Dr Marco Cantoni

10:30-11:45 Practical: HR-TEM image simulation with JEMS, Dr Marco Cantoni
                    Please bring your laptop (Mac or Windows) for simulation session

lunch

13:15-14:15 Practical: STEM image simulations with Dr. Probe, Dr. Victor Boureau
                   Please bring your laptop (Windows) for simulation session

14:15-15:00 Field measurement in a TEM, Dr. Victor Boureau

15:15-16:15 Advanced EDX microanalysis, Dr. Marco Cantoni

16:15-17:00 Tomography, Dr. Marco Cantoni

DEMOS on the microscopes  | Groups assigned during the course

(see program)

Group 1:

 9h00 - 10h00: Tecnai Osiris (room MXC-030)

10h30 - 12:00: Titan Themis (room MXC-012)

Group 2:

 8h30 - 10h00: Titan Themis (room MXC-012)

10h30 - 11:30: Tecnai Osiris (room MXC-030)