Metrology

Course summary

• Announcements (Forum)

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Week1 - February 16: Introduction class, Système International (SI)

• General course introduction (File)
• Introduction of instructors (File)
• Introduction to the SI (File)

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Week2 - February 23: Optical Metrology/1 (Optical Microscopy)

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Week3 - March 2: Nanoscale Metrology/1 (SEM)

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Week4 - March 9: Nanoscale Metrology/2 (AFM)

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Week5 - March 16: Basic Statistics & Experimental Examples/1

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Week6 - March 23: Basic Statistics & Experimental Examples/2

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Week7 - March 30: Electrical Metrology/1

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Week8 - April 13: Electrical Metrology/2

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Week9 - April 20: Electrical Metrology/3

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Week10 - Apr 27: Optical Metrology/2 (Optical Image Sensors)

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Week11 - May 4: Optical Metrology/3 (SPADs)

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Week12 - May 11: Quantum Metrology/1

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Week13 - May 18: Quantum Metrology/2

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Week NN - ...: Nanoscale Metrology/3 (Nanomagnetism)

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Q&A Session - June 2026

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