Advanced Transmission Electron Microscopy

Exam date: 3 October 2023 10:00-12:00, MXC-116 (CIME library)

Exam: you select a paper that shows the use of one or several advanced EM techniques and present a 10min. summary to the experts. Then we ask you questions related to this and other techniques that have been presented in the course for another 10 min.

Total time 20min. (10&10). Individual presentations, order will be determined later.

Please send us a copy of the paper beforehand for approval (1 week before exam).

Room DIA003

10:00-10:15 Welcome

10:15-12:00 Introduction to STEM, Dr Emad Oveisi

lunch

13:15-14:15 EELS Basics, Dr Duncan Alexander

14:30-16:30 Advanced STEM techniques: DPC and 4D-STEM, Dr Victor Boureau

ROOM DIA003

laptop (PC or Mac) required

08:15-09:00 Phase Contrast Imaging in TEM, Dr Marco Cantoni

09:00-10:00 Practical JEMS SE simulations, Dr Marco Cantoni
                   Please bring your laptop (Mac or Windows) for simulation session

10:30-11:30 Field measurement in a TEM, Dr. Victor Boureau

lunch

13:15-14:00 Aberration-corrected S/TEM, Dr. Victor Boureau

14:00-15:00 Practical: STEM image simulations with Dr. Probe, Dr. Victor Boureau
                   Please bring your laptop (Windows) for simulation session

15:30-17:00 Advanced EDX microanalysis
                    Tomography, Dr. Marco Cantoni

DEMO: 

09:0-10:00: Tecnai Osiris (room MXC-030)

10:30-12:15: Titan Themis (room MXC-012)